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The Hiden HPR-60 molecular beam mass spectrometer is a compact skimmer inlet MS ...
The laser MBE is very suitable for the atomic layer controlled growth of oxides ...
Pascal Sputtering system is suitable For Accurate Multi Layer Deposition，Higher ...
The IG20 features a high brightness electron impact gas ion source which is desi...
The IG5C features a low power, high brightness, surface ionisation source couple...
The Hiden MAXIM quadrupole SIMS analyser is a state of the art secondary ion mas...
The Hiden MAXIM quadrupole SIMS analyser is a state of the art secondary ion mas...
The Hiden SIMS Workstation provides for high performance static and dynamic SIMS...
The TPD Workstation features a multiport UHV chamber with heated sample stage co...
The IMP-EPD is a differentially pumped, ruggedised secondary ion mass spectromet...
A system for the analysis of secondary positive and negative ions from solid sam...
Hiden plasma probes measure some of the key plasma parameters and provide detail...
The EQP system directly measures mass and energy of both positive and negative p...
品牌：Hiden 型號：TOF-qSIMS 制造商：Hiden Analytical Ltd 產(chǎn)地： 英國
The HPR-30 is a residual gas analyser configured for analysis of gases and vapou...
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